Design for Manufacturability and Yield for Nano-Scale CMOS

E-Books: Design for Manufacturability and Yield for Nano-Scale CMOS

Written for:
ASIC/ SOC designers, EDA R&D engineers, professors and graduate students

Keywords:
-CAD (Computer aided design)
-CAE (Computer aided engineering)
-DFM (Design for manufacturability)
-DFY (Design for yield)
-SOC (System on a chip design)

ES + RS + DF | PDF | 11.7MB

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